MTechnology logoHigh current switch, LDX, MIT



RISK SCIENCE for Mission Critical Facilities

Understand and manage the causes of downtime.  

Applying the science of risk to the engineering of mission critical facilities.

Practical, actionable answers to the toughest reliability questions and choices.

What's NEW @ mtechnology...
  JUNE 2015

Class: New Data Center Metric Targets Probability and Risk
Rich Miller, June 23, 2015, Data Center Frontier.

7x24 Exchange 2015 Spring Conference: Connect, Collaborate, Deliver
June 7- 10, 2015     Orlando, FL

Class - A Risk Metric for Mission Critical Facilities
Speaker:   Steve Fairfax, MTechnology
Keynote Address: June 9, 2015, 9:00 


  MAY 2015

"What Is RCM and How Could It Be Applied to the Critical Loads?"
Arno, R.; Dowling, N.; Fairfax, S.; Schuerger, R.J.; Weber, J.,
"What Is RCM and How Could It Be Applied to the Critical Loads?," Industry Applications, IEEE Transactions on , vol.51, no.3, pp.2045,2053, May-June 2015
[doi: 10.1109/TIA.2014.2379951]


 JUNE 2014
7x24 Exchange 2014 Spring Conference: the Data Revolution
June 1- 4, 2014      Boca Raton, FL

eBay - Quantitative Comparison of Critical Facility Electrical System Architectures.  
Speakers: Dean Nelson and James Monahan, eBay;  Steve Fairfax, MTechnology
Keynote Address: June 3, 2014, 9:00

  Power News & Resources:  Power Links






HOME | About Us | Services & Solutions | People | Contact Us | SEARCH

Copyright ©MTechnology, Inc.